Region-Based Epipolar and Planar Geometry Estimation in Low─Textured Environments

Given two views of the same scene, usual correspondence geometry estimation techniques exploit the well-established effectiveness of keypoint descriptors. However, such features have a hard time in poorly textured man-made environments, possibly containing repetitive patterns and/or specularities, such as industrial places. In that paper, we propose a novel method for two-view epipolar and planar geometry estimation that first aims at detecting and matching physical vertical planes frequently present in these environments, before estimating corresponding homographies. Inferred local correspondences are finally used to improve fundamental matrix estimation. The gain in precision is demonstrated on industrial and urban environments.