Homoepitaxial GaN layers studied by low-energy electron microscopy, atomic force microscopy and transmission electron microscopy
1999
Keywords:
- Scanning confocal electron microscopy
- Condensed matter physics
- Low-energy electron microscopy
- Optoelectronics
- Conductive atomic force microscopy
- Energy filtered transmission electron microscopy
- Photoconductive atomic force microscopy
- Transmission electron microscopy
- Atomic force microscopy
- Physics
- Analytical chemistry
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