Laser‐plasma soft x‐ray absorption spectroscopy of laser‐ablated Si and C particles

Time‐resolved X‐ray absorption spectroscopy using laser plasma has been developed to measure the time evolution of the electronic and geometrical structures of laser ablated particles and their spatial distribution. This method is demonstrated to have potential for pulsed‐laser induced, fast‐phase changes like laser annealing and laser ablation. Laser‐ablated particles of silicon and carbon have been investigated by this method to clarify dynamics of ablated particles. We show the obtained results of laser ablation of Si and C, the first experimental determination of Si–L2,3 edges of Si atom and ions, and absorption lines suggesting formation of Si clusters and negative C ions.