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Electrostatic Charges and Ion Implantation Impact on the MIS Transistors Parameters Degradation
Electrostatic Charges and Ion Implantation Impact on the MIS Transistors Parameters Degradation
2019
G.A. Mustafayev
N.V. Cherkesova
A I Khasanov
A. G. Mustafayev
Keywords:
Ion implantation
Degradation (geology)
Transistor
Optoelectronics
Materials science
Electric charge
Threshold voltage
Correction
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