Structural and Dielectric Properties of La0.5Pr0.2Ba0.3Mn1−xTixO3 (x = 0.0 and 0.1) Manganite

In this work, we study the structural and dielectric properties of La0.5Pr0.3Ba0.2Mn1-xTixO3 (x = 0.0 and 0.1) samples prepared using the solid-state reaction technique. The X-ray structural analysis using Rietveld refinement method exhibits that both compounds are single phase and crystallize in the rhombohedral structure with R $${ }\overline{3}{ }$$ C space group. In addition, a scanning electron microscopy (SEM) study proved an increase in the grain size with substitution of Mn by Ti in the B site. The dielectric properties of these compounds have been studied by complex impedance spectroscopy in the frequency range from 40 Hz to 1000 kHz and temperatures from 100 K to 200 K. The DC conductivity decreases with the substitution of Ti, and the experimental data were fitted by Jonscher’s universal power law. The impedance plot exhibits semicircle arcs at different temperatures. Similarly, the variations of imaginary parts of modulus and impedance show an electrical relaxation phenomenon with non-Debye nature for both samples. The values of the activation energy are determined from the conductivity data analysis and imaginary impedance.