ZnSe quality analysis by x-ray luminescence

The x-ray luminescence of the unintentionally doped polycrystalline ZnSe samples has been studied at the wide spectral range. Comparative study of x-ray luminescence and photoluminescence spectra has been made. The analysis of purity and quality of ZnSe by x-ray luminescent measurements is advantageous because of the bulk character of the x-ray excitation and the possibility of testing big squares. The peculiar features of x-ray spectra of unintentionally doped ZnSe lead us to conclude that this material has high optical quality.© (1994) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.