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X線光電子分光法によるSiO 2 /SiC界面層の組成分析
X線光電子分光法によるSiO 2 /SiC界面層の組成分析
2000
Hijikata Yasuto
Iida Takeshi
Yaguchi Hiroyuki
Yoshikawa Masahito
Yoshida Sadafumi
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