Scanning electrochemical microscopy: preparation of submicrometer electrodes

In this report, we describe two procedures for the construction of submicrometer microelectrodes particularly suited for use in SECM. In one, an electrochemically sharpened Pt wire is sealed in a glass capillary and the submicrometer tip is exposed via mechanical polishing, and in the other, electron beam lithography using a commercial scanning electron microscope is used to produce submicrometer features at the tip of a polymer-coated polyshed Pt wire