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Threshold voltage shift due to incidental pulse on non-stressed pins during HBM testing
Threshold voltage shift due to incidental pulse on non-stressed pins during HBM testing
2014
Yue Zu
Liang Wang
Rajkumar Sankaralingam
Scott Ward
Joe Schichl
Keywords:
Electrical engineering
Electronic engineering
Pulse (signal processing)
Threshold voltage
Engineering
Correction
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