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Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing
Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing
1999
Mike Bruce
Greg Dabney
Shawn McBride
Jason Mulig
Victoria J. Bruce
Charles Bachand
Steven Kasapi
Jeffrey A. Block
Keywords:
Waveform
Materials science
Optoelectronics
Silicon
Correction
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