Calculations of dynamic stresses in the envelopes of pulsed Xe flashlamps

We have modeled dynamic stresses in the envelopes of pulsed xenon flashlamps, treating stresses produced by three different sources: the heating of the envelope by the plasma; the pressure rise of the xenon gas; and magnetic forces, due to currents flowing in nearby lamps. The heat-induced stresses were calculated by the finite element method, using uniform heating rates for the inside surface of the envelope that were inferred from flashlamp radiant efficiency measurements. Pressure-induced stresses were calculated analytically, using empirical relationships for temperature and pressure in terms of current density. Magnetically-induced stresses were also calculated analytically, for flashlamps packed parallel to each other in linear arrays.