EIGER characterization results

Abstract Characterization and performance measurements have been done on several EIGER detector systems, produced with chips coming from two different lots, both with a lab X-ray source and at the Swiss Light Source (SLS). Results on the detector calibration, electronic noise, threshold dispersion, minimum achievable energy threshold, maximum detectable incoming photon flux and maximum frame rate are presented. An EIGER module is constructed from a ∼ 4 × 8 cm 2 monolithic silicon sensor bump-bonded to 2 ×4 readout chips and contains 0.5 Mpixel. The first EIGER 500 K systems have been produced and images taken with these detectors are shown. Modules can be tiled together to form large area detectors; both a 9 Mpixel and a 16 Mpixel systems are at present under development for the coherent small angle X-ray scattering and protein crystallography beamlines of the SLS.