Nanoparticle measurement device and method

The invention discloses a nanoparticle measurement device and method. The nanoparticle measurement device comprises a sample cell which is horizontally arranged, wherein a charge coupled device (CCD) microscope is arranged above the sample cell; the CCD microscope is connected with a computer; a semiconductor laser is arranged below the sample cell; and an inclined angle of 10 to 80 degrees is formed between the semiconductor laser and the sample cell. According to the nanoparticle measurement device and method, the semiconductor laser is arranged on the CCD microscope, and a certain inclined angle is formed between the semiconductor laser and the sample cell, so that the nanoparticles in the sample cell generate dynamic scattered light spots under irradiation of laser beams, the particle size and particle size distribution of the particles from dozens of nanometers to several nanometers are measured according to the Brownian motion equation proposed by Einstein; and therefore, the measurement precision and stability can be guaranteed, the production cost can be greatly reduced, and the nanoparticle measurement device is simple in structure and easy to popularize and use.