Old Web
English
Sign In
Acemap
>
Paper
>
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material
2003
H. Toutah
Boubekeur Tala-Ighil
J.F. Llibre
B. Boudart
Taieb Mohammed-Brahim
Olivier Bonnaud
Keywords:
Policide
Engineering
Metal gate
Electronic engineering
Thin-film transistor
Polysilicon depletion effect
Optoelectronics
Degradation (geology)
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
2
Citations
NaN
KQI
[]