Reliability Accelerated Testing of MEMS Acccelerometers
2007
An attempt to assess the reliability of a batch of MEMS accelerometers is presented. The testing plan is application oriented and contains combined tests: thermal and mechanical stresses (two variants: vibration and tilting) were used. The results demonstrated the good reliability of the tested device, the failure rate being smaller than 6.10 -8 h -1 .
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
4
References
2
Citations
NaN
KQI