Random error of determining light scattering matrix elements at various polarization states of probing radiation

Using the method of mathematical modeling, we consider the transformation of a random error of light intensity measurement into an error of determining elements of the light scattering matrix. We consider a device in which the polarization properties of probing radiation change depending on the setting of the phase plate and polarization analysis of scattered radiation is performed while the second phase plate located ahead of a stationary analyzer is rotated. A set of settings of the first phase plate has been revealed, which provides a minimum random error in determining the scattered light matrix elements.