Compendium of Recent Radiation Test Results from the Johns Hopkins University Applied Physics Laboratory

Chi H. Pham,Daniel F. Caughran,J.J. Likar

Compendium of Recent Radiation Test Results from the Johns Hopkins University Applied Physics Laboratory

2019

Chi H. Pham
Daniel F. Caughran
J.J. Likar

Total Ionizing Dose (TID), Enhanced Low Dose Rate Sensitivity (ELDRS), and Single Event Effect (SEE) test results are presented for a variety of analog, digital, mixed signal, and Radio Frequency (RF) devices.

Keywords:

Applied physics
Systems engineering
Engineering
Electrical engineering
Compendium
Absorbed dose
Radio frequency
Mixed-signal integrated circuit
Radiation
low dose rate
single event effect

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