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Electrically Detected Magnetic Resonance in Silicon Nitride Thin Films of Widely Varying Stoichiometries
Electrically Detected Magnetic Resonance in Silicon Nitride Thin Films of Widely Varying Stoichiometries
2019
Ryan Waskiewicz
Elias Frantz
P. M. Lenahan
Sean King
Keywords:
Silicon nitride
Thin film
Electrically detected magnetic resonance
Stoichiometry
Optoelectronics
Materials science
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