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8p-B-6 High-Resolution Imaging of GaAs(110)using Electrostatic Force Microscopy
8p-B-6 High-Resolution Imaging of GaAs(110)using Electrostatic Force Microscopy
1997
Yasuhiro Sugawara
T. Uchihashi
H. Ueyama
Masayuki Abe
Y. Nakao
Seizo Morita
Keywords:
Non-contact atomic force microscopy
Analytical chemistry
Photoconductive atomic force microscopy
Kelvin probe force microscope
Electrostatic force microscope
Materials science
high resolution imaging
Optoelectronics
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