Study of Ag/Si(111) submonolayer interface II. Atomic geometry of Si(111) (3 × 3)R30°-Ag surface

Abstract Final state diffraction of Ag 3d X-ray photoelectrons from the Si(111) ( 3 × 3 )R30°- Ag surface has been measured. From a kinematical analysis of the diffraction patterns, it is found that a buried honeycomb framework of Ag atoms is formed on the surface with lateral displacement of the first Si layer.