Nondestructive measurement of nonlinear conduction of nanoscale materials, nanoscale SiO2, and K0.3MoO3 by pulse photoconductivity method

We propose a pulse photoconductivity method (PPCM) for the nondestructive measurement of nanoscale materials with abrupt transitions into higher conduction states from insulated states. The nonlinear conductivity of the highly insulating SiO2 and the charge density wave (CDW) are observed and demonstrated in a short time even for long-time-constant circuits. One can determine the instantaneity of the PPCM in the case of applying an in-line evaluation technique to the LSI industry.