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Comparison of SIMS and AES depth profile analyses of a Ni/Cr multilayer system
Comparison of SIMS and AES depth profile analyses of a Ni/Cr multilayer system
1984
Hubert Gnaser
F. G. R denauer
William A. Steiger
G. Flentje
W. O. Hofer
U. Littmark
Janos Giber
Daniele Marton
Peter E. Braun
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