Signal Integrity of Bump-Less High-Speed through Silicon Via Channel for Terabyte/s Bandwidth 2.5D IC

In this paper, a bump-less high-speed through silicon via (TSV) channel is proposed for terabyte/s bandwidth 2.5D IC. The signal integrity of the proposed channel is analyzed based on the frequency and time domain simulation. To analyze the signal integrity of the proposed channel minutely, the proposed channel and the conventional channel are simulated and compared respectively. Moreover, unlike the conventional channel, the signal integrity of the proposed channel is significantly affected by the coupling pads capacitance. Therefore, the proposed channel performance is investigated with different coupling pads capacitances.