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Predictive approach of SEU occurrence induced by neutron in SRAM and EEPROM
Predictive approach of SEU occurrence induced by neutron in SRAM and EEPROM
2015
jinxiaoming
Shanchao Yang
Da Li
Wenshou Zhang
Chenhui Wang
Ruibin Li
Guizhen Wang
baixiaoyan
Chao Qi
Yan Liu
Keywords:
Neutron
EEPROM
Static random-access memory
Electronic engineering
Materials science
Embedded system
Physics
Correction
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