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An Automated, High-Throughput System for GISAXS and GIWAXS Measurements of Thin Films
An Automated, High-Throughput System for GISAXS and GIWAXS Measurements of Thin Films
2017
Eric Schaible
Jessica Jiménez
Matthew Church
eunhee Lim
Polite Stewart
Alexander Hexemer
Keywords:
Thin film
Grazing-incidence small-angle scattering
Analytical chemistry
Throughput
Materials science
Optoelectronics
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