Quantitative imaging of anisotropic material properties with vectorial ptychography

Following the recent establishment of the formalism of vectorial ptychography [Ferrand et al., Opt. Lett. 40, 5144 (2015)], first measurements are reported in the optical range, demonstrating the capability of the proposed method to map the four parameters of the Jones matrix of an anisotropic specimen, and therefore to quantify a wide range of optical material properties, including power transmittance, optical path difference, diattenuation, retardance, and fast-axis orientation.