Фототок в структурах кремний/титанат стронция/никель

The SrTiO 3 (strontium titanate xerogel) films were fabricated on the substrates of monocrystalline silicon using the sol-gel method at the annealing temperature 750 °С. The upper nickel electrodes were fabricated using the magnetron sputtering, and the volt-amperic characteristics of the obtained structures were measured. Photocurrent was observed from the structure silicon/strontium titanate/nickel under illumination with the halogen lamp, as well as switching from low resistance state to high resistance state under and without illumination.