Experimental investigations of commercial gas discharge tube “Osram St 111” using time lag measuring method

The results of the breakdown time lags obtained by commercial “OSRAM St 111” gas diode are presented. The memory curves for different voltages (for 220, 250 and 300 V) are shown. The analysis of the experimentally obtained distributions (histograms and Laue distributions) for different voltages (for 220, 250 and 300 V) and different relaxation times (from 1 to 1500 ms), as well as the analysis of the randomness of the experimental results are performed. The performed statistical analysis of time lag distributions indicates two different mechanisms that lead to breakdown. First of them is characterized by the exponential distribution and the second by the Gaussian distribution.