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An in-process, layer wise surface metrology system for a new E-Beam additive manufacturing machine
An in-process, layer wise surface metrology system for a new E-Beam additive manufacturing machine
2020
Liam Blunt
Yue Liu
Zonghua Zhang
Chris Smith
David C. Knight
Feng Gao
Andrew Townsend
Xiangqian Jiang
Keywords:
Optics
Surface metrology
Cathode ray
Electron beam processing
Materials science
Work in process
powder bed
layer wise
Correction
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