Position resolution studies with MSU 32-fold segmented HPGe detector

We present position sensitivity measurements obtained with one of the 32-fold segmented HPGe detectors from Michigan State University. These measurements were performed with a collimated beam of /sup 137/Cs gamma rays scattered by 90 degrees. This deposits 374 keV at a given location inside the crystal. A position resolution can be determined over many events by examining the digitally recorded pulse shapes on the 32 electrical contacts. If position resolution is adequate, gamma ray Compton camera imaging may be possible.