Theoretical study of time-resolved luminescence in semiconductors. IV. Lateral inhomogeneities

In the fourth part of this series, we study the impact of lateral inhomogeneities on the time-resolved luminescence decay (TRL) after a pulsed excitation by means of simulation with Synopsys® TCAD and analytical approximation. This work consists of two parts: In the first part, the effect of excitations being inhomogeneous on a lateral scale is investigated. It turns out that for localized excitations there may be a strong lateral diffusion of charge carriers, thereby limiting the resolution of a micro-TRL experiment. In this case, a replacement of the inhomogeneous excitation in the simulation by a homogeneous excitation and an average photon density is not possible, especially due to defect saturation depending non-linearly on the excitation. In the second part, we consider a homogeneous excitation and study inhomogeneous material parameters, namely, inhomogeneous charge carrier lifetimes, band gaps, and doping densities. We find that their effects strongly depend on their characteristic lengths of vari...