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Non-destructive chemical depth-profiling of plasma polymers by variable excitation energy XPS
Non-destructive chemical depth-profiling of plasma polymers by variable excitation energy XPS
2003
Iris Retzko
Sufal Swaraj
Wolfgang E. S. Unger
Nobuyuki Matsubayashi
Motoyasu Imamura
Tomoaki Tanaka
Hiromichi Shimada
Keywords:
X-ray photoelectron spectroscopy
non destructive
Polymer
Profiling (computer programming)
Excitation
Plasma
Energy (signal processing)
Analytical chemistry
Materials science
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