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Internal Electric-Field Imaging of Power Devices Using Nitrogen-Vacancy Centers in Diamond
Internal Electric-Field Imaging of Power Devices Using Nitrogen-Vacancy Centers in Diamond
2018
Kwangsoo Kim
Kosuke Mizuno
Toshiharu Kato
Hiromitsu Kato
Masahiko Ogura
Daisuke Takeuchi
Satoshi Yamasaki
Mutsuko Hatano
Takayuki Iwasaki
Keywords:
Diamond
Nitrogen
Engineering physics
Power semiconductor device
Vacancy defect
Electric field
Materials science
Correction
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