Modeling Charge Buildup in Deposited Oxides under X-Ray and Gamma Irradiation

Anatoly A. Smolin,A.V. Sogoyan,Anastasia V. Ulanova,Alexander A. Demidov

Modeling Charge Buildup in Deposited Oxides under X-Ray and Gamma Irradiation

2015

Anatoly A. Smolin
A.V. Sogoyan
Anastasia V. Ulanova
Alexander A. Demidov

Analysis of TID degradation differences for MOS-structures under x-ray and gamma irradiations is provided. Correlation between spatial distribution of hole traps in the oxide and TID degradation kinetic is determined.

Keywords:

Physics
Optoelectronics
Irradiation
X-ray
Atomic physics
Kinetic energy
Degradation (geology)
Distribution function
Spatial distribution
gamma irradiation
Oxide

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