Material receiving mechanism of planar flying-probe tester

The invention provides a material receiving mechanism of a planar flying-probe tester. The material receiving mechanism comprises a base, a material pushing device and a material holding device, wherein the material pushing device comprises sliding devices arranged on the base, a material pushing base plate arranged on the sliding devices as well as a material pushing driving device for driving the material pushing base plate to move leftwards and rightwards; and the material holding device is arranged on the material pushing base plate and comprises material holding mechanisms for holding a PCB (Printed Circuit Board) and a material holding driving device for driving the material holding mechanisms to vertically move. The material receiving mechanism and a needle bed are seamlessly butted, and the PCB to be tested is automatically conveyed to the flying-probe tester for testing by the material pushing device and the material holding device, so that the retesting efficiency is greatly improved, and the scrappage rate and the retesting cost of the PCB are reduced.