Old Web
English
Sign In
Acemap
>
Paper
>
Using Atomic Force Microscopic Adhesion Measurement to Study the Surface Dynamics of Polymer Thin Films
Using Atomic Force Microscopic Adhesion Measurement to Study the Surface Dynamics of Polymer Thin Films
2000
O. K. C. Tsui
X.P. Wang
T. K. Ng
Xudong Xiao
Keywords:
surface dynamics
Composite material
Materials science
polymer thin films
Adhesion
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]