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Technometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection
Technometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection
2018
A.V. Semenov
V.N. Starcev
E. N. Stepanov
Keywords:
Counterfeit
Electronic engineering
Integrated circuit
Computer science
Reliability engineering
Correction
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