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Atomic Force Microscopy(AFM) and cross sectional Scanning Transmission Electron Microsscopy(STEM) of Ge on Si(100).
Atomic Force Microscopy(AFM) and cross sectional Scanning Transmission Electron Microsscopy(STEM) of Ge on Si(100).
1997
Michael McKay
Jeff Drucker
John Silcox
Keywords:
Atomic force microscopy
Optoelectronics
Electron
Materials science
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