Angle-scanned photoemission: Fermi surface mapping and structural determination

Abstract A brief survey of the angle-scanned photoemission technique is given. It incorporates two complementary methods in one: 1. Mapping of X-ray excited photoelectron intensities over virtually the complete hemisphere above the sample surface results in extended data sets where important surface-geometrical structure information is extracted and even “fingerprinting” is possible. This method is known as the very powerful angle-scanned X-ray photoelectron diffraction. 2. Mapping ultraviolet-excited photoelectron intensities as a function of emission angles gives the possibility to do band mapping as well as to study the Fermi surface of single crystals very directly. Therefore, by switching between X-rays and ultraviolet-photons, it is possible to study the geometrical and electronic structure within the same experiment.