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Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy
Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy
2019
Manuel Ulreich
Lynn A. Boatner
Igor Sokolović
Michele Reticcioli
Berthold Stoeger
Flora Poelzleitner
Cesare Franchini
Michael Schmid
Ulrike Diebold
Martin Setvin
Keywords:
Nanotechnology
Microscopy
Science, technology and society
Dopant
Chemical substance
Materials science
Scintillator
Correction
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