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Detection of Charge Traps in Silicon Nanowire MOSFETs Using Transient Current Measurements
Detection of Charge Traps in Silicon Nanowire MOSFETs Using Transient Current Measurements
2020
Boyang Cui
Tomoko Mizutani
Kiyoshi Takeuchi
Takuya Saraya
Masaharu Kobayashi
Toshiro Hiramoto
Keywords:
Nanowire
Charge (physics)
silicon nanowires
Optoelectronics
Materials science
transient current
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