Research on neutron-irradiated 6H-SiC crystals by x-ray diffraction
2011
Single crystal SiC has become more and more important semiconductor material due to its excellent physical and
chemical properties. The present paper reports a study of characteristics of unirradiated and irradiated SiC. 6H-SiC
single crystals were irradiated at approximately 60-80 o C to a neutron fluence of 5.74×10 18 n/cm 2 .The radiation damage
and the defect recovery in the single crystals were investigated by X-ray diffraction meter. The experimental observation
on diffraction peaks of different crystal faces shows that there are serious damages in the neutron-irradiated 6H-SiC
crystals and amorphization appears at one of the measured planes. The restoration of radiation damage occurred during
the isochronal annealing process, and the recovery feature is depended on annealing temperature. The X-ray diffraction
data show that the radiation damages remained almost unchanged below the temperature of 600 o C, and the healing
process got more and more obvious while the annealing temperature is beyond 600 o C. It is found that beyond 600 o C the
crystal structure gradually reordered and the FWHM of face (006) peak reveals a linear recovery behavior with
increasing annealing temperature. High-temperature detector can be made according to the linear recovery law in order
to achieve the measurement of the high-temperature environment.
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