Вихретоковая диагностика алюминиевых сплавов с диэлектрическим покрытием

Microprocessor eddy current device that allows to determine and control the thickness of the dielectric coatings on conductive objects was developed. In case of insufficient accuracy of measurement, this device has the advantage over the eddy current probes based on the analysis of hodographs without using a microcontroller. The use of the microcontroller allowed to apply digital signal processing effective to suppress random noise. Using analog-to-digital converter allowed to reduce the performance requirements of the microcontroller conducting data processing. To test the efficiency of this device were performed test measurements on the aluminum alloy AMg5 with different thickness of the dielectric coating. It is noted that the results consistent with theoretical calculations in the literature. It is concluded about the possibility of using this device to control the thickness of the dielectric coatings on aluminum alloys.