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Impact of screening of latent defects at electrical test on the yield-reliability relation and appli
Impact of screening of latent defects at electrical test on the yield-reliability relation and appli
1998
Jacob A. van der Pol
E.R. Ooms
T. Van 'T Hof
F.G. Kuper
Keywords:
Failure rate
Reliability engineering
Operant conditioning
Psychology
Correction
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