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Characterization of 1 inch AlN Single Crystal Wafers Grown by PVT Method
Characterization of 1 inch AlN Single Crystal Wafers Grown by PVT Method
2019
He Guangdong
Wang Qikun
Lei Dan
Gong Jianchao
Huang Jiali
Fu Danyang
Wu Liang
Keywords:
Optoelectronics
Wafer
Single crystal
Materials science
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