RF/Microwave Broadband Characterization of Paper Substrates

The accurate knowledge of dielectric substrate characteristics is essential in designing RF and Microwave printed circuit boards. In this work, a straightforward method based on microstrip transmission lines for characterization of paper substrates is implemented. By using this technique, the frequency-dependent behavior of dielectric constant ϵ r and loss tangent tanδ of the paper are extracted from 10MHz to 10GHz. To validate this technique, the ADS simulation results and the measurement results of a miniature circuit based on an interdigital capacitor on paper are compared and they show a good agreement.