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Characterization of Near-Interface Oxide Traps with the Charge Pumping Method
Characterization of Near-Interface Oxide Traps with the Charge Pumping Method
2018
Toshiaki Tsuchiya
Masahiro Hori
Yukinori Ono
Keywords:
Oxide
Atomic physics
Materials science
charge pumping
Optoelectronics
Correction
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