Miniaturized FPGA-Based High-Resolution Time-Domain Reflectometer

Time-domain reflectometry (TDR) is a well-known measurement principle for evaluating frequency-dependent electric and dielectric properties of various materials and substances. Although TDR is a proven method, the high price for TDR measurement equipment and complex laboratory setups is often a limiting factor for cost-sensitive applications or large-scale field experiments, where a large number of TDR meters is required. This paper reports on the development of a new miniaturized low-cost TDR meter capable of sampling a repetitive rectangular waveform, which is used as an excitation signal. The developed sampling circuit is based on a digital delta modulator (DM) and allows for capturing the waveform of a repetitive measurement signal. A 1-MHz signal can be captured with a virtual sampling resolution of 1 ps within a measurement interval of 1 s. The generated pulses have a rise time of 2 ns and can be captured with an amplitude resolution of approximately 10 bit and an accuracy of approximately 8 bit. The developed digital DM architecture is implemented inside a small field programmable gate array and integrated into a miniaturized low-power TDR meter prototype for battery-powered outdoor applications. The captured measurement data are stored on integrated micro-SD card memory and can be read out either via a Universal Serial Bus, an RS-485 bus system, or a wireless interface. The TDR meter is controlled by an integrated microcontroller and a real-time clock and therefore can operate completely independent from any additional control setup. The TDR meter targets applications within the field of geoscience and agricultural monitoring, where large-scale measurement systems are required.