Old Web
English
Sign In
Acemap
>
Paper
>
A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor
A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor
2010
Matsumoto Takashi
Makino Hiroaki
Kobayashi Kazutoshi
Onodera Hidetoshi
Keywords:
High fidelity
Electronic engineering
CMOS
Materials science
Computer science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]