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Study of 180mTa Decay by Ultra-low Background HPGe Detector
Study of 180mTa Decay by Ultra-low Background HPGe Detector
2017
Chan Wei-Min
T. Kishimoto
S. Umehara
K. Matsuoka
S Yoshida
Keywords:
Detector
Analytical chemistry
Semiconductor detector
Physics
Optics
hpge detector
Correction
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